Technology - Superior energy resolution

: SDD detector module with light element window

XFlash^® SDD detectors stand for superior energy resolution whether measured at manganese Kα or in the light element range. The passive thermoelectric cooling and heat dissipation guarantees an absolutely vibration free operation of the detector.

The small and lightweight detector design permits adaption to most SEM chamber geometries and TEM columns. Therefore XFlash^® detectors are also well suited for benchtop XRF systems. When used on a SEM or TEM the mechanical strain on the electron column is minimized.

: 4th generation SDD chip

The signal processing technique used was especially designed and optimized for SDD detectors and allows extremely high pulse throughput without loss of accuracy.

Based on state-of-the-art radiation entrance window technology robust, leakage free, pressure resistant detector windows are provided, enabling un-compromised light element performance.

XFlash^® Detectors are completely maintenance free. They do not require any cooling liquids or other consumables and therefore are also suited for the use in clean rooms of all classes.

Radiation entrance windows

: Transmission of different radiation entrance window types

Depending on the application you may choose from the following window materials:

Beryllium
DuraBeryllium™
Light element window (slew)
High temperature light element window (hlew)

More Information

Working Principle - Silicon drift chamber principle (SDD)