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- Bruker Acquires Hecus MICROcaliX(R) Product Line to Expand Product Portfolio for Small Angle X-ray Scattering (SAXS)
- Lab Report SC-XRD 46 - Higher Dimensional Crystallography
- Customer Service testimonial from Dale Kronkright, Head of Conservation at Georgia O'Keeffe Museum
- Bruker Launches D8 QUEST and D8 VENTURE Crystallography Systems with Novel High Intensity X-ray Sources for Structural Biology
- Bruker Announces New Website and Online Store for AFM Probes
Upcoming Events
- The Benefits of TXRF for Education and University Research
Mar 07, Webinar - Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
Working Principle - Silicon drift chamber principle (SDD)
- Cross section of a SDD detector chip
The XFlash® Detector is an energy dispersive X-ray detector based on the silicon drift chamber principle (SDD). The detector crystal is moderately cooled by vibration free thermo-electric coolers; any generated heat is dissipated by passive convection without the need for additional cooling.
A monolithically integrated on-chip FET acts as a signal amplifier and supports unprecedented energy resolution. The sideward depletion of the active detector volume in connection with the integrated drift structure provides an extremely small detector capacitance that enables the use of fast signal processing techniques. The pulse throughput of XFlash® Detectors is higher than that of other energy dispersive systems by more than an order of magnitude.
- Schematic of the SDD working principle
Guarantees a good transmission for the X-rays
A super thin radiation entrance window separates the sensitive detector area from the ambient atmosphere and guarantees a good transmission for the X-rays of interest.
