XFlash® SDD Detectors

The XFlash® SDD Detector family

Bruker AXS Microanalysis - more that ten years experience in SDDs

The XFlash® Detector has ushered in the beginning of a new era: X-ray detection close to room temperature with excellent energy resolution and extremely high pulse load capacity.

The core piece of this innovative system is a silicon chip which functions according to the drift chamber principle. Due to the special chip design with integrated charge amplifier the XFlash® can process extremely high count rates and at the same time displays a very good energy resolution, unrivalled by any other energy dispersive X-ray detector.

The XFlash® offers the following advantages over conventional thermoelectrically or liquid nitrogen cooled detectors:

  • Excellent energy resolution
  • Extremely high pulse load capacity
  • No elaborate, vibration-generating cooling systems
  • Low operating cost
  • Maintenance-free operation
  • Small dimensions
  • Low weight

Since their introduction in 1997, more than 2,000 XFlash® Detectors have been shipped, which are used for a variety of spectroscopic applications.