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- Bruker Announces New High-Performance Scientific Instruments and Analytical Solutions for Life-Science Research, Industrial and Applied Markets at Analytica 2012
- Successful Bruker/MIT Symposium 2012
- Bruker Announces Acquisition of SkyScan, a Leading Provider of Micro-CT Systems for 3D X-Ray Imaging in Materials Research and Preclinical Studies
- Application Note SC-XRD 390 - The Reactivity of Lithium Organics
- Application Note SC-XRD 389 - Challenging in Many Aspects
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - Introducing XFlash® 6
Jun 13, Webinar - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
XFlash® SDD Detector
Bruker Nano - more that ten years experience in SDDs.
The XFlash® Detector has ushered in the beginning of a new era: X-ray detection close to room temperature with excellent energy resolution and extremely high pulse load capacity.
The core piece of this innovative system is a silicon chip which functions according to the drift chamber principle. Due to the special chip design with integrated charge amplifier the XFlash® can process extremely high count rates and at the same time displays a very good energy resolution, unrivalled by any other energy dispersive X-ray detector.
The XFlash® offers the following advantages over conventional thermoelectrically or liquid nitrogen cooled detectors
- Excellent energy resolution
- Extremely high pulse load capacity
- No elaborate, vibration-generating cooling systems
- Low operating cost
- Maintenance-free operation
- Small dimensions
- Low weight
Since their introduction in 1997, more than 3,000 XFlash® detectors have been shipped, which are used for a variety of spectroscopic applications.
More Information
Working Principle – Silicon drift chamber principle (SDD)
Technology – Superior energy resolution
XFlash® 5010 (PDF specsheet)
XFlash® 5030 (PDF specsheet)


