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- Bruker Acquires Hecus MICROcaliX(R) Product Line to Expand Product Portfolio for Small Angle X-ray Scattering (SAXS)
- Lab Report SC-XRD 46 - Higher Dimensional Crystallography
- Customer Service testimonial from Dale Kronkright, Head of Conservation at Georgia O'Keeffe Museum
- Bruker Launches D8 QUEST and D8 VENTURE Crystallography Systems with Novel High Intensity X-ray Sources for Structural Biology
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- The XFlash® SDD Detector family
XFlash® SDD Detector
Bruker Nano - more that ten years experience in SDDs.
The XFlash® Detector has ushered in the beginning of a new era: X-ray detection close to room temperature with excellent energy resolution and extremely high pulse load capacity.
The core piece of this innovative system is a silicon chip which functions according to the drift chamber principle. Due to the special chip design with integrated charge amplifier the XFlash® can process extremely high count rates and at the same time displays a very good energy resolution, unrivalled by any other energy dispersive X-ray detector.
The XFlash® offers the following advantages over conventional thermoelectrically or liquid nitrogen cooled detectors
- Excellent energy resolution
- Extremely high pulse load capacity
- No elaborate, vibration-generating cooling systems
- Low operating cost
- Maintenance-free operation
- Small dimensions
- Low weight
Since their introduction in 1997, more than 3,000 XFlash® detectors have been shipped, which are used for a variety of spectroscopic applications.
More Information
Working Principle – Silicon drift chamber principle (SDD)
Technology – Superior energy resolution
XFlash® 5010 (PDF specsheet)
XFlash® 5030 (PDF specsheet)
