Language
Search
News
- Bruker Announces New High-Performance Scientific Instruments and Analytical Solutions for Life-Science Research, Industrial and Applied Markets at Analytica 2012
- Successful Bruker/MIT Symposium 2012
- Bruker Announces Acquisition of SkyScan, a Leading Provider of Micro-CT Systems for 3D X-Ray Imaging in Materials Research and Preclinical Studies
- Application Note SC-XRD 390 - The Reactivity of Lithium Organics
- Application Note SC-XRD 389 - Challenging in Many Aspects
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - Introducing XFlash® 6
Jun 13, Webinar - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
XFlash® LE SDD Detector
The XFlash® LE detector further expands the application range of Benchtop-EDXRF systems such as the S2 RANGER. Due to the ultrathin high transmission entrance window the XFlash® LE SDD with 50 W excitation power eliminates conventional limitations of EDXRF systems and significantly enhances the sensitivity for light elements, such as sodium and magnesium. The special chip design with integrated charge amplifier the XFlash® can process extremely high count rates and at the same time displays a very good energy resolution, unrivalled by any other energy dispersive X-ray detector.
The XFlash® LE offers unique analytical performance making it the best in class solution for EDXRF
- Eight times more sensitivity for Sodium
- Four times more sensitivity for Magnesium
- Best in class peak to background ratio
- Excellent energy resolution
- Extremely high pulse load capacity
- No elaborate, vibration-generating cooling systems
- Low operating cost
- Maintenance-free operation
- Small dimensions
- Low weight


