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- Bruker Acquires Hecus MICROcaliX(R) Product Line to Expand Product Portfolio for Small Angle X-ray Scattering (SAXS)
- Lab Report SC-XRD 46 - Higher Dimensional Crystallography
- Customer Service testimonial from Dale Kronkright, Head of Conservation at Georgia O'Keeffe Museum
- Bruker Launches D8 QUEST and D8 VENTURE Crystallography Systems with Novel High Intensity X-ray Sources for Structural Biology
- Bruker Announces New Website and Online Store for AFM Probes
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Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
- The XFlash® LE Detector
XFlash® LE SDD Detector
The XFlash® LE detector further expands the application range of Benchtop-EDXRF systems such as the S2 RANGER. Due to the ultrathin high transmission entrance window the XFlash® LE SDD with 50 W excitation power eliminates conventional limitations of EDXRF systems and significantly enhances the sensitivity for light elements, such as sodium and magnesium. The special chip design with integrated charge amplifier the XFlash® can process extremely high count rates and at the same time displays a very good energy resolution, unrivalled by any other energy dispersive X-ray detector.
The XFlash® LE offers unique analytical performance making it the best in class solution for EDXRF
- Eight times more sensitivity for Sodium
- Four times more sensitivity for Magnesium
- Best in class peak to background ratio
- Excellent energy resolution
- Extremely high pulse load capacity
- No elaborate, vibration-generating cooling systems
- Low operating cost
- Maintenance-free operation
- Small dimensions
- Low weight
