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- Bruker meets the challenges of nanoanalysis
- Bruker AXS Microanalysis Introduces New Ultra-High Energy Resolution XFlash® 5000 Silicon Drift Detector Series at M&M 2008
- Dr. Joseph Goldstein, Distinguished Professor,University of Massachusetts, Amherst Wins 2008 Duncumb Award for Excellence in Microanalysis
Upcoming Events
- AXSCEM 2009
Sep 14-16, Karlsruhe - 20th International Congress on X-ray Optics and Microanalysis
Sep 14-18, Karlsruhe
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XFlash® QUAD 5040 Detector
- The XFlash® QUAD 5040 Detetctor
The XFlash® QUAD 5040 is a four channel silicon drift detector (SDD) for energy dispersive spectrometry. This member of our new XFlash® 5000 SD detector family impresses with incredible speed and sensitivity.
The QUAD provides a total active area of
40 mm² which is divided into 4 separate channels of 10 mm² each.
The great advantage of this innovative design concept is that the detector maintains the high energy resolution of a single 10 mm² SDD while offering 4 times the solid angle and throughput capability.
Combining the large active area with high energy resolution of down to < 123 eV (at Mn Kα and 100,000 cps) makes the XFlash® QUAD highly efficient for elemental analyses even in low beam current situations, e.g. in high resolution imaging mode or for the analysis of sensitive samples.
But not only traditional spectrum acquisition can be significantly sped up. While maintaining excellent energy resolution, the XFlash® QUAD accepts up to 3,000,000 cps input count rate. Therefore this detector is also ideal for new analytical techniques, such as spectral imaging (PTS, HyperMap). While most EDS systems offer this useful feature, it tends to be very time consuming when done with conventional Si(Li) based spectrometers. With the performance of the XFlash® QUAD it is now possible to use spectral imaging as the technique of choice for routine analysis.
Also, the outstanding performance of this detector makes it the instrument of choice on microprobes, during their normal operation! In fact the XFlash® QUAD 5040 expands the area of application of these instruments. It is now possible to analyze rough and tilted samples as well as particles in these samples. Mapping and HyperMap at low to medium resolutions is now possible (which would normally require stage movements, severely reducing analysis speed). Also, as a user of such an instrument, you will appreciate that the number of elements that can be analyzed simultaneously no longer depends on the number of WD spectrometers you have installed on your microprobe.
Like all XFlash® Detectors the QUAD does not require liquid nitrogen or any other cooling agents and operates absolutely vibration free.
