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- New Large Area EDS Detector for Transmission Electron Microscopy
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
- Bruker Announces the e-Flash HR – a New High-Resolution EBSD Detector
- Bruker AXS in Karlsruhe has new phone numbers
- Prof. David C. Joy wins 2010 Duncumb Award for Excellence in Microanalysis
Upcoming Events
- Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
- The XFlash® 5030 T Detector
XFlash® 5030 T Detector
The XFlash® 5030 T detector is the first silicon drift detector specifically designed for use in transmission electron microscopy. It is equipped with an SDD chip that has an active area of 30 mm². The slender detector finger offers optimal geometric conditions and enables a large solid angle for signal collection, as it allows the detector tip to be positioned close to the sample. The UHV-suitable design with motorized retraction and welded bellows complete the image.
The XFlash® 5030 T offers
- very good energy resolution (133 eV at MnKα and 100,000 cps guaranteed, also available: 127 eV at MnKα and 50,000 cps and 129 eV at MnKα and 75,000 cps)
- extremely high pulse load capability up to 750,000, immediate recovery after crossing TEM grid bars
- very good light element performance (detection range boron (5) to americium (95)),
- no elaborate, vibration-generating cooling systems, no boiling LN2,
- includes welded bellows and shutter,
- optional motorization,
- low operating cost,
- maintenance-free operation,
- small dimensions,
- low weight.
We recommend the XFlash® 5030 T for
- EDS systems for TEMs and STEMs,
- EDS systems for aberration corrected electron microscopes.
