QUANTAX EDS
The XFlash® 5030 Detector
The XFlash® 5030 Detector

XFlash® 5030 Detector

One of the main features of the XFlash® 5030 Detector is that its SDD chip has an active area of 30 mm² housed in a detector finger no wider than that of our 10 mm² XFlash® 5010 Detector. This means it offers the same optimal geometric conditions of this detector plus the added benefit of having triple the sensitive area and therefore also covering three times the solid angle, providing three times the count rate under the same excitation conditions.

These properties make this detector the instrument of choice for low beam current / count rate conditions like found in cold-cathode field emission SEMs or environmental SEMs. Nevertheless, the XFlash® 5030 can also easily cope with high input count rates up to 750,000 cps.

In summary, the XFlash® 5030 offers the following advantages

  • very good energy resolution (133 eV at Mn Kα at 100,000 cps guaranteed, also available are 127 eV at Mn Kα and 50,000 cps and 129 eV at Mn Kα and 75,000 cps)
  • extremely high pulse load capacity,
  • very good light element performance (detection range boron (5) to americium (95) possible),
  • no elaborate, vibration-generating cooling systems,
  • immediately available after power-on,
  • low operating cost,
  • maintenance-free operation,
  • small dimensions,
  • low weight.

We recommend the XFlash® 5030 for

  • EDS systems for SEMs (especially field emission or environmental SEMs),
  • high sensitivity and high resolution XRF systems.

More Information

Working Principle – Silicon drift chamber principle (SDD)

Technology – Superior energy resolution

XFlash® detector 5030 – The specialist in small beam current applications (PDF spec sheet)