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- Bruker Acquires Hecus MICROcaliX(R) Product Line to Expand Product Portfolio for Small Angle X-ray Scattering (SAXS)
- Bruker Introduces the Alloy Guide App for Mobile Devices
- Bruker Announces $1.3 Million Contract with ThyssenKrupp Stainless USA
- Bruker and Symphony Environmental Sign Agreement on X-Ray Fluorescence (XRF) Technology Enabling Identification of the Components of Plastic
- Customer Service testimonial from Dale Kronkright, Head of Conservation at Georgia O'Keeffe Museum
Upcoming Events
- The Benefits of TXRF for Education and University Research
Mar 07, Webinar - Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
Fundamentals of XRF Analysis - Workshop Overview
First Session
- Safety training
- X-ray Theory and Technology
- Fundamentals of X-ray Interaction Physics
- X-ray analysis software Operation
- X-ray sample analysis
Second Session
- Focus on Analysis optimization
- Analysis of unknowns "lab rat mode"
- Low mass analysis
- Random element optimization
Third Session
- Focus on Quantification
- Pitfalls and realities
- Spread sheet calibration process
- Play time
