XFlash® 4010 Detector

The XFlash® 4010 Detector

The core piece of this innovative X-ray detection system is a silicon chip which functions according to the drift chamber principle.

Due to the special chip design with integrated charge amplifier the XFlash® can process very high count rates and at the same time displays an excellent energy resolution, unrivalled by any other energy dispersive X-ray detector.

In summary, the XFlash® 4010 offers the following advantages over conventional thermoelectrically or liquid nitrogen cooled detectors:

  • excellent energy resolution (version with 125 eV at MnKα at 100,000 cps available)
  • extremely high pulse load capacity,
  • excellent light element performance (version with Be detection capability available),
  • no elaborate, vibration-generating cooling systems,
  • immediately available after power on,
  • low operating cost,
  • maintenance-free operation,
  • small dimensions,
  • low weight,
  • affordable pricing.

Areas of application for the XFlash® 4010 are

  • EDS systems for SEMs,
  • fast mapping systems for SEMs and
  • high-resolution XRF systems.