White Light Interferometric Optical Profilers

Precision, Non-Contact 3D Surface Metrology Systems

White light interferometric (WLI) optical profilers from Bruker are optimized to address a wide range of advanced production Quality Assurance/Quality Control (QA/QC) and R&D precision machining and manufacturing applications within the high brightness LED, solar, ophthalmic, semiconductor, medical device and academic research markets. Based on ten generations of proprietary technology advances, Bruker's white light interferometric profilers feature patented, higher brightness dual-LED illumination that, when combined with the systems' superior vertical resolution, provide the high sensitivity and stability necessary for precision, non-contact 3D surface metrology in applications and environments that are challenging for other metrology systems.

	ContourGT-K0 Optical Profiler Affordable, Quantitative, Bench-Top Surface Metrology		ContourGT-K1 Optical Profiler Bench-Top Surface Metrology for Research and Manufacturing
	ContourGT InMotion 3D Optical Microscope Enhanced Capability for Device Motion Analyses		ContourGT-X3 Optical Profiler High-Performance Production Floor Surface Metrology
	ContourGT-X8 Optical Profiler Gauge-Capable Metrology for Process Quality Control		ContourGT-X8 PSS Optical Profiler Precision Surface Metrology for HB-LED PSS Production
	NPFLEX 3D Surface Metrology System Delivering New Perspective to Large-Sample Precision Manufacturing		NPFLEX-LA 3D Surface Metrology System Simultaneously Quatifies Surface Texture and Lead Angle Metrology
	SP9900+ Large-Format Surface Profiling System Unmatched Measurement Performance on Flat Panels		HD9800+ Optical Profiler for Data Storage Accurate and Versatile Process Control Monitoring
	Optical Metrology Module Stand-Alone WLI Metrology Module for Critical Measurement Needs