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Electron backscatter diffraction (EBSD) and energy dispersive X-ray spectrometry (EDS) are common analytical methods used on the scanning electron microscope (SEM). The two complementary techniques provide structural and respectively compositional information. Continuing to build on its recent developments in integrating EBSD and EDS, Bruker is now releasing an advanced phase identification feature. This new method will significantly increase efficiency when dealing with multiphase materials and allow expert as well as less experienced users to acquire the best quality results. View webinar Advanced phase ID using combined EBSD&EDS on SEM.

Electron backscatter diffraction (EBSD) and energy dispersive X-ray spectrometry (EDS) are common analytical methods used on the scanning electron microscope (SEM). EBSD provides structural and EDS compositional information. Due to tough requirements on hard- and software for combined analysis, both are mostly used separately or provide quite low acquisition rates. Recent developments in Bruker’s technology enable simultaneous EBSD and EDS analysis with speeds of several hundreds of patterns per second. So why not obtain structural and chemical information at the same time and gain maximum information on a sample? View webinar Combined EBSD and EDS analysis on SEM

For many years Bruker has pioneered the design and production of multi-SDD systems and multi-channel SD detectors for EDS on scanning electron microscopes and microprobes. In this webinar we want to show which systems are currently available from Bruker and what their benefits are. The webinar will therefore contain a multitude of application examples.
View webinar Multi-Channel Detectors for EDS on SEM

Quantitative EDS analysis has become a standard method in the characterization of samples in the electron microscope. The software shipped with modern energy dispersive spectrometry systems provides good results in automatic analysis modes with little user interaction for many routine applications.

However, there may be cases where less satisfactory or even wrong results are obtained. This can have a number of different causes, most common are element peak overlaps, and – nowadays of increasing importance – the necessity to analyze the peaks of elements at low energies. The latter mainly results from the desire to improve spatial resolution of bulk sample EDS analyses by reducing the accelerating voltage of the scanning electron microscope. Thanks to the efficiency and energy resolution of state-of-the-art EDS detectors, analysis of specimens at accelerating voltages of 5 kV or lower within reasonable time has become possible. View webinar Developments in quantitative EDS analysis

Silicon drift detectors are a well established analytical technology on scanning electron microscopes. Bruker AXS Microanalysis, as the technological leader in this field, is the first company that has adapted SDDs for optimal operation on transmission electron microscopes. View webinar Revolutionizing EDS analysis on TEMs using silicon drift detectors

The ability to quickly and accurately map element distribution over a sample area has become essential to material analysts involved with QA/QC, forensics, art conservation, and other scientific disciplines. High-speed X-ray detectors, coupled with powerful Spectrum Imaging tools, now automatically extract composition information in minutes, making X-ray microanalysis techniques practical for even routine applications.
View webinar Practical Spectrum Imaging: Rapid Collection for Routine Analysis