Webinars

Revolutionizing EDS analysis on TEMs using silicon drift detectors

Silicon drift detectors are a well established analytical technology on scanning electron microscopes. Bruker AXS Microanalysis, as the technological leader in this field, is the first company that has adapted SDDs for optimal operation on transmission electron microscopes. more...

Challenges in Nanoanalysis

Continuing technological advances require the elemental analysis of increasingly smaller structures in many industrial fields, including biological applications,  semiconductors, and nanotechnology in general. This confronts the otherwise well proven electron microscope based energy dispersive spectroscopy with new  challenges. more...

Practical Spectrum Imaging: Rapid Collection for Routine Analysis

The ability to quickly and accurately map element distribution over a sample area has become essential to material analysts involved with QA/QC, forensics, art conservation, and other scientific disciplines. High-speed X-ray detectors, coupled with powerful Spectrum Imaging tools, now automatically extract composition information in minutes, making X-ray microanalysis techniques practical for even routine applications. more...