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- XFlash® 6 – Bruker Introduces the Next Generation of EDS Detectors
- Bruker Announces New High-Performance Scientific Instruments and Analytical Solutions for Life-Science Research, Industrial and Applied Markets at Analytica 2012
- Bruker Announces Acquisition of SkyScan, a Leading Provider of Micro-CT Systems for 3D X-Ray Imaging in Materials Research and Preclinical Studies
- New Large Area EDS Detector for Transmission Electron Microscopy
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - Introducing XFlash® 6
Jun 13, Webinar - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
The Bruker VZ-Adapter – Maximum efficiency and flexibility in EDS signal collection
- XFlash with VZ-Adapter
The unique VZ (variable Z)-Adapter is available as an accessory to all XFlash® detectors. This unique tool allows the user to tilt the detector in vertical direction (Z). This can be done in-situ, meaning under vacuum and normal SEM operation. This provides unprecedented flexibility in analysis. The VZ-Adapter can be used to
- provide optimum X-ray collection conditions if the analytical working distance (WD) needs to be changed, e.g. in case of large sample inspection
- bring the detector as close as possible to the pole piece (or even past it, if permissible), which maximizes the solid angle of X-ray collection. This is particularly advantageous when analyzing samples with low X-ray yield, like organic or beam-sensitive materials.
- SEM chamber with sample on the left, EBSD detector screen (lower right) with ARGUS FSE/BSE detector, EDS detector (top right) and microscope pole piece (top)
Simultaneous EBSD and EDS analysis at highest speeds with the VZ-Adapter
The VZ-Adapter is also an important aid for simultaneous EBSD and EDS analysis at high speeds. While the e-Flash EBSD detector can be brought into optimum analytical position using its built-in vertical screen shift feature, the VZ-Adapter allows to do the same with the XFlash® EDS detector. This greatly improves the flexibility for combined analysis, by
- making it possible to change the working distance to accommodate samples of varying sizes or by being able to analyze very large sample areas of up to 5 x 5 mm² in a single measurement
- optimizing the collection conditions for the XFlash®, resulting in better count statistics, which in turn allow to speed up the measurement.
The VZ-Adapter is compatible with EBSD detectors with ARGUS™ forescattered / backscattered electron detector installed and does not interefere with its operation.
