VITA's Scanning Thermal Microscopy (SThM)

VITA technology adds high resolution thermal characterization capabilities to existing Bruker Scanning Probe Microscopes (SPM).

Now SPM users not only benefit from unmatched core performance, but can add a traditional bulk characterization technique. The VITA option builds on Bruker’s extensive expertise with thermal measurements — providing extended thermal measurement performance through:

• Improved lateral resolution capabilities (to <100 nm)
• Full digital control of heating cycles
• Productive VITA control integration enabled by Bruker systems open architecture

VITA technology provides superior material characterization in two ways:

• Nanoscale Thermal Analysis
• Scanning Thermal Microscopy