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VITA: AFM Nanoscale Thermal Analysis Module

Superior Scanning Thermal Microscopy and nTA for your AFM

VITA technology adds high resolution nanoscale thermal characterization capabilities to Bruker's Dimension® Icon® AFM, Dimension Edge AFM, and MultiMode® 8 SPM.

Now AFM users not only benefit from unmatched core performance, but can add a traditional bulk characterization technique. The VITA: AFM Nanoscale Thermal Analysis Module builds on Bruker's extensive expertise with thermal measurements — providing extended thermal measurement performance through:

• Improved lateral resolution capabilities (to <100 nm)
• Full digital control of heating cycles
• Productive VITA control integration enabled by Bruker systems open architecture

VITA technology provides superior material characterization in two ways:

• Nanoscale Thermal Analysis (nTA)
• Scanning Thermal Microscopy

VITA AFM Nanoscale Thermal Analysis Module (PDF application note)