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- Product Success Story: Bruker Nano Surfaces Division Ships 100th DektakXT Stylus Profiler
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Alcon Selects Bruker ContourGT 3D Microscope for Intra-Ocular Lens R&D
- Bruker’s AcuityXR Receives R&D 100 Award for Technological Innovation
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - Introducing XFlash® 6
Jun 13, Webinar - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
SOM Trade Journal Articles
Bruker’s scientists and applications specialists share their knowledge via dozens of trade journal articles and interviews each year. Below are links to some of these industry articles. Please note that some of the hosting publications require registration or subscription to read the full article.
Improved Copper Wire Bonding with Non-Contact Metrology (March 2012 – Solid State Technology) | |
Copper wire is fast gaining popularity for chip bonding, but it is a less understood and less mature process than bonding with gold. A 3D optical microscope can help provide data needed for imprint studies aimed at process optimization and sampling. |
Solid State Technology
March 2012 |
Surface Metrology: Measuring Form and Function (Feb 16, 2012 – American Machinist) | |
The performance, reliability and longevity of machined parts often depend on the physical characteristics of their functional surfaces. However, legacy surface roughness parameters, such as Ra, are frequently insufficient to reliably predict surface function. The need for functional surface metrology parameters extending beyond roughness information drove the creation of true three-dimensional (3D) areal surface parameters, denoted as S parameters. ISO standardization for the computations made to provide those data is found in ISO 25178-2. This article reviews the definitions of some of these parameters and shows how they correlate with part function. It also describes how the 3D optical microscope is able to accurately, repeatably, and reproducibly provide data for computation of these surface parameters for virtually any machined surface, and provides some examples of the utility of these S parameters. |
American Machinist
Feb 16, 2012 |
Precision Shaft Metrology with No Strings Attached (Jan 2012 – Automotive Engineering International) | |
There are 80 or more dynamic seals in a typical automobile that can suffer possible failure. Contemporary manufacturing techniques produce smoother shafts than ever before, and measurement of shafts for smoothness is difficult using traditional means. New instrumentation that meets fabricators’ needs for measuring surfaces with unprecedented precision while simultaneously providing quantitative and repeatable information is needed. |
Automotive Engineering International Jan 2012 |
3-D Optical Microscopy Expands Applications (Dec 2011 – Photonics Spectra) | |
High-speed operation has enabled the 3-D optical microscope to transition successfully from a precision laboratory instrument to a rugged, frontline industrial tool for quality control and process-monitoring applications in diverse industries. Recent cutting-edge developments in the core technology have dramatically improved the X-Y resolution of these versatile areal measurement systems. |
Photonics Spectra Dec 2011 |
3-D optical microscopy often complements rather than replaces 2-D stylus contact methods. The combination of methods provides a complete surface analysis that is extremely valuable to researchers and manufacturers, particularly in micromanufacturing. This article discusses the primary attributes of each technique, the issues that must be addressed when introducing 3-D surface metrology and how 2-D and 3-D techniques can be combined for comprehensive surface characterization and process control. |
MICROmanufacturing Nov/Dec 2011 |
Traditional measurement methods such as Fizeau interferometers and 2D stylus profilers do not provide sufficient accuracy of the comprehensive 3D measurements needed for the manufacture of the nanometer features that control the geometry of finished lenses. A new generation of noncontact optical profilers provides complete 3D surface measurements to a higher level of accuracy at high speeds. |
MEDS |
3D Interferometric Microscopy Reveals Medical Implant Wear Mechanisms (Oct 2011 – Laser Focus World) | |
Bruker Corp. (Santa Barbara, CA) says that 3D microscopy based on white-light interferometry can provide high-speed measurement with higher lateral resolution and better vertical measurement accuracy than competing technologies, including 2D stylus metrology and confocal microscopy. Furthermore, 3D optical microscopy has a noncontact advantage: Stylus systems can induce mechanical filtering due to the contact-tip radius and can also damage the surface under test. In addition to surface-metrology and inspection applications in the automotive, aerospace, solar, and semiconductor markets, these systems are also suited to surface characterization of medical devices such as hip implants. Learn about Bruker's White Light Interferometric Profilometers |
Laser Focus World Oct 2011 |
With the help of software modeling, the AcuityXR from Bruker Nano Surfaces Division, Tucson, Ariz., can obtain lateral resolution 3D microscope images of objects down to 130 nm, the hightest resolution achieved in a commercial device. Learn about AcuityXR Enhanced-Resolution Optical Microscopy Technology |
R&D Sept 2011 |
Today’s top-performing 3-D optical microscopes provide quantitative evaluation of materials prior to implantation to determine the wear characteristics of surfaces in a variety of preparations (uncoated, coated, polished, etc.). This evaluation enables the manufacture of implants with improved wear, comfort, flexibility, and prolonged life. Learn about the ContourGT 3D Optical Microscopes Learn about Medical Applications of the ContourGT 3D Optical Microscopes |
OrthoTec Sept 2011 |
This article describes two types of gauge-capable metrology tools that are currently used to refine production methods and to develop devices with better performance: the atomic force microscope (AFM), and the white-light interferometer (WLI). Because of its very high speed, the WLI in particular is poised to become a key quality-control (QC)/process-monitoring tool as production volumes of relatively new devices are pushed to ever higher levels. Learn about ContourGT X8 PSS 3D Optical Microscope Learn about ContourGT 3D Optical Microscopes Learn about the Dimension Edge PSS Atomic Force Microscope Learn about Medical Applications of the ContourGT 3D Optical Microscopes |
LEDs Magazine Sept 2011 |
White-light interferometry is a relatively new proven and quantifiable approach that utilizes the properties of light to achieve topographical measurements of surfaces with feature heights from nanometers to several millimeters. This article will explore shaft surface measurement challenges, describe the various measurement options in detail and discuss the pros and cons of each alternative. Learn about the Non-Contact, 3D Surface Metrology System for Lead Angle (NPFLEX-LA) |
EE Times |
Solar Cell Efficiency from Surface Characterization (March 2011– PhotoVoltaics World) | |
As the solar cell manufacturing process evolves, makers are looking for ways to quantify the photovoltaic (PV) cell surface. Dr. Erik Novak from Bruker, presenter from the PV manufacturing sessions, Renewable Energy World/Photovoltaics World Conference & Expo, explains that PV cell surface quantification helps us understand where the cell’s final efficiency will be and that 3D surface characterization can provide in-line or near-line process monitoring. Learn about ContourGT 3D Optical Microscopes Learn about Solar Applications of Stylus and Optical Metrology Systems |
PhotoVoltaics World March 2011 |
Microscopy Technology Results in Sharper Images (March 2011 – Quality Magazine) | |
AcuityXR is an enhanced-resolution microscopy technology that combines patent-pending hardware and software to determine what a part under test truly is while breaking the optical diffraction limit. As a result, blurred features turn out sharper and the heights of narrow structures are more accurately measured. Learn about the Non-Contact, 3D Surface Metrology System for Lead Angle (NPFLEX-LA) |
Quality Magazine March 2011 |
