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- D2 PHASER with XFlash® Detector - Combined XRD, EDXRD, and XRF analysis
- Testimonial for Dr. Bruce Kaiser's Hands-on workshop: Accurate Elemental Non-destructive XRF
- Testimonial for Dr. Bruce Kaiser's Hands-on workshop: Accurate Elemental Non-destructive XRF
- Bruker Elemental announces the winner of our S1 Sorter giveaway contest
- S1 SORTER testimonial from TP Consulting Services
- 4th International SAXS/GISAXS Workshop (PDF)
Sep 09-11, Leoben, Austria - Navigated Atomic Force Microscopy - N8 NEOS
Sep 15, Free Webinar - 17th Bruker Users‘ Group Meetings 2010 - Single Crystal X-ray Diffraction
Sep 19-22, Karlsruhe, Germany - Good Diffraction Practice III - Powder XRD Instrumentation and Data Quality
Sep 30, Free Webinar - COM2010 - Conference of Metallurgists
Oct 03-06, Vancouver, British Columbia, Canada
Tracer III-V/III-SD
There are many reasons why the Tracer family has become the preferred instrument for leading conservation scientists around the world. It combines the power and flexibility you would expect from a bench-top instrument with the convenience of a handheld – thanks to some pioneering, user-oriented innovations. These include the same vacuum technology that we originally developed in partnership with NASA for the space shuttle program. The instrument also comes with powerful laptop-based analytical software, live-time spectral display, and customizable filters and secondary targets, designed to optimize your analysis no matter what the application.
These analyzers allow complete user control of the excitation conditions - current, voltage and user selected filter for optimization of measurement conditions for investigation of your objects. The Tracer III-SD incorporates the proprietary X-Flash® Silicon Drift Detector (SDD) which provides high speed data acquisition, better resolution than the traditional SiPIN detector and light element sensitivity. When the Tracer III-SD is operated with the optional vacuum system the ultimate light element sensitivity can be achieved.
In addition to the basic instrument the system is supplied with: 1) powerful lap-top based analytical software which provides live spectral display and complete peak identification; 2) a tripod mount which allows precise three dimensional positioning of the analyzer and 3) unmatched application training and support.
The benefits at a glance
- The capabilities of a bench-top instrument, with the convenience of a handheld
- Powerful laptop-based analytical software
- Customizable filters and secondary targets to optimize analysis
- Live-time spectral display
- Vacuum technology developed in partnership with NASA for the space shuttle program
- Standard package includes 360o tripod
- Proprietary X-FLASH® SDD technology (Tracer III-SD and IV-SD only)
- Unmatched training and support
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S1 TURBOSD
- The first ever SDD-based handheld analyzer
- Superior count rates and resolution
- Five times faster than previous generations
- Lower detection limits
- Grade library covers low alloy steel, tool steel, stainless steel, nickel alloys, cobalt alloys, copper alloys, aluminum alloys, titanium alloys, zirconium alloys and tungsten alloys
- Easy analysis of light elements, such as magnesium, aluminum and silicon, without the need for vacuum or helium atmosphere (S1 TURBOSD LE only)
S1 TURBOSDR
- For Restricted Materials Analysis
- The first ever SDD-based handheld analyzer
- Superior count rates and resolution
- Lower detection limits
- Rh based X-ray tube
S1 SORTER
- Best value in the market
- Performance equal to any available system using a SiPIN detector
- Covers all common classes of metal
- Cost 30% less than other available choices





