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- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - Introducing XFlash® 6
Jun 13, Webinar - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
Torsional Resonance Tunneling AFM (TR TUNA)
- Steps on HOPG as seen by the tip operating in TR mode
Torsional Resonance Tunneling AFM (TR TUNA) is an enhanced TUNA option for our MultiMode and Dimension platforms. It allows TUNA to be used on soft or otherwise delicate samples by using torsional resonance (TR) mode instead of contact mode.
This greatly reduces vertical and lateral tip forces on samples while keeping the tip in the near field where the TUNA currents can be measured. This capability is especially important for polymer, thin film, and nanoelectronics applications.
