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- 4th International SAXS/GISAXS Workshop (PDF)
Sep 09-11, Leoben, Austria - Navigated Atomic Force Microscopy - N8 NEOS
Sep 15, Free Webinar - 17th Bruker Users‘ Group Meetings 2010 - Single Crystal X-ray Diffraction
Sep 19-22, Karlsruhe, Germany - Good Diffraction Practice III - Powder XRD Instrumentation and Data Quality
Sep 30, Free Webinar - COM2010 - Conference of Metallurgists
Oct 03-06, Vancouver, British Columbia, Canada
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TOPAS Profile
This course is intended for users of profile analysis by using the fundamental parameter approach. The course goals are to impart knowledge of the method as well as to gain practical experience in handling the X-ray diffractometer. The main focus is on using the DIFFRACplus TOPAS software package. Lectures, demonstrations, and individual training at the PC will allow for independent practical work. Furthermore, you are encouraged to bring your questions, problems, practical examples, and experiences to the course. The training will be held in English or German.
This course is part of the TOPAS Rietveld Analysis course, which covers a five days customer training.
| Part Number | Location | Dates | Deadline | Language | |
| 7KP18018BW | Karlsruhe | Oct 18-19 | Sep 21 | in English | |
| Dec 13-14 | Nov 15 | in German | |||
Good knowledge of English is necessary. The number of participants is limited to a minimum of 3 participants. The course price includes course materials, lunch and refreshments. Travel and accommodation are not included. For cancellation within 10 working days before the start of the course, we will charge a cancellation fee of 30 %. Booked persons not attending the course without having given prior notice will be fully charged. To register, fill out the following registration form.