Lengua

This course is intended for users of profile analysis and Rietveld refinement by using the fundamental parameter approach. The course goals are to impart knowledge of the method as well as to gain practical experience in handling the X-ray diffractometer. The main focus is on using the DIFFRAC^plus TOPAS software package. Lectures, demonstrations, and individual training at the PC will allow for independent practical work. Furthermore, you are encouraged to bring your questions, problems, practical examples, and experiences to the course.

Good knowledge of English is necessary. The number of participants is limited to a minimum of 3 participants. The course price includes course materials, lunch and refreshments. Travel and accommodation are not included. For cancellation within 10 working days before the start of the course, we will charge a cancellation fee of 30 %. Booked persons not attending the course without having given prior notice will be fully charged. To register, fill out the following registration form.