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- Bruker Announces New High-Performance Scientific Instruments and Analytical Solutions for Life-Science Research, Industrial and Applied Markets at Analytica 2012
- Bruker Announces Acquisition of SkyScan, a Leading Provider of Micro-CT Systems for 3D X-Ray Imaging in Materials Research and Preclinical Studies
- Application Note SC-XRD 390 - The Reactivity of Lithium Organics
- Application Note SC-XRD 389 - Challenging in Many Aspects
- Bruker Expands its Small Angle X-ray Scattering (SAXS) Product Portfolio
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - Introducing XFlash® 6
Jun 13, Webinar - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
Thin Film Analysis
This course is intended for users of thin film analysis, to impart fundamental knowledge of the method, consisting of reflectometry, high resolution and grazing incidence diffraction, as well as to gain practical experience in using the X-ray diffractometer. The main focus is on using the D8 DISCOVER MR (Material Research) and the DIFFRACplus LEPTOS software. Furthermore, you are encouraged to bring your questions, problems, practical examples, and experiences to the course. The training will be held in English.
| Part Number | Location | Dates | Deadline | Language | |
| 7KP18018DB | Karlsruhe | Aug 06-10 | Jul 06 | English | |
Good knowledge of English is necessary. The number of participants is limited to a minimum of 3 participants. The course price includes course materials, lunch and refreshments. Travel and accommodation are not included. For cancellation within 10 working days before the start of the course, we will charge a cancellation fee of 30 %. Booked persons not attending the course without having given prior notice will be fully charged. To register, fill out the following registration form.
