Lengua

This course is intended for users of analytical X-ray diffraction systems. The course goals are to impart fundamental knowledge of X-ray based texture analysis and determination of the orientation distribution function ODF. Step by step, you get the know-how required for receiving best information from your X-ray experiments. The main focus is on using the different measurement assemblies and the software DIFFRAC^plus TEXTURE and MULTEX V3. Lectures, demonstrations, and individual training at the PC will allow for independent practical work. Furthermore, you are encouraged to bring your questions, problems, practical examples, and experiences to the course. The training will be held in English.

Good knowledge of English is necessary. The number of participants is limited to a minimum of 3 participants. The course price includes course materials, lunch and refreshments. Travel and accommodation are not included. For cancellation within 10 working days before the start of the course, we will charge a cancellation fee of 30 %. Booked persons not attending the course without having given prior notice will be fully charged. To register, fill out the following registration form.