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- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - Introducing XFlash® 6
Jun 13, Webinar - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
Surface Potential Mode (SP)
- Composite image of Height and Surface potential of a laser diode (8μm scan)
Surface Potential (SP) imaging is a secondary imaging mode derived from TappingMode that maps the electrostatic potential on the sample surface. SP is a nulling technique. As the tip travels above the surface in LiftMode union the tip and the cantilever experience a force wherever the potential on the surface is different than the potential of the tip. The force is nullified by varying the voltage of the tip so that the tip is at the same potential as the region of the sample surface underneath it.
SP imaging can be used to detect and quantify contact potential differences (CPD) on the surface.
