Language
Search
News
- Product Success Story: Bruker Nano Surfaces Division Ships 100th DektakXT Stylus Profiler
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Alcon Selects Bruker ContourGT 3D Microscope for Intra-Ocular Lens R&D
- Bruker’s AcuityXR Receives R&D 100 Award for Technological Innovation
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - Introducing XFlash® 6
Jun 13, Webinar - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA

Solar Industry — Roughness Characterization
Characterizing Photovoltaic Cell Surfaces
Solar energy materials that are slightly rough trap more light than perfectly smooth surfaces, and thus achieve greater output. However, surfaces that are too rough lose efficiency through excessive scattering and less absorption. Clearly, roughness characterization has a great deal of importance in the development and manufacture of photovoltaic cells. Bruker is an industry leader in this area and our 3D microscopes, stylus profilers, and surface metrology technologies have several decades of ground-breaking experience in rapidly quantifying the surface characteristics of materials with sub-nanometer resolution.
Stylus Profiler Solution For Solar Roughness Characterization
The DektakXT Surface Profiler is the culmination of four decades of stylus profiler technology innovations that enables superior performance, versatility and value for solar industry and research engineers.
• DektakXT Stylus Surface Profiling System
3D Microscopes For Solar Roughness Characterization
The ContourGT Family of 3D Microscopes are the most comprehensive and intuitive surface metrology platform available today for photovoltaic cell production, solar industry research and solar technology manufacturing quality control applications.
Solar Roughness Characterization & Surface Profiling Application Notes
Download our free PDF application notes relating to the roughness characterization of solar materials, enabling gains in solar efficiency with precision metrology, and the advantages that the versatile Dektak Stylus Profiler can provide to anyone working in the solar industry.
• Precision Surface Metrology Enables Solar Efficiency Gains (5.8 MB)
• Surface Texture Analysis Using Dektak Stylus Profilers (1.2 MB)
More Information
Solar Cell Efficiency from Surface Characterization (Publication, March 2011– PhotoVoltaics World)

