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BRUKER AXS provides dedicated advanced software solutions for X-ray fluorescence Analysis (XRF) enabling to achieve the maximum analytical performance from the X-ray fluorescence spectrometers of the S4 series (WDXRF) and the S2 RANGER (EDXRF) and providing best support for all kind of analytical tasks.

SPECTRAplus and SPECTRA EDX: Easy to use software solutions for energy dispersive and wavelength dispersive X-ray fluorescence analysis for the maximum of performance in elemental analysis.

ML plus: Advanced multilayer and thin film analysis by X-ray fluorescence Analysis (XRF) in Research and production.

ARTAXControl: Control and evaluation software for the quick and easy utilzation of the unique features of the ARTAX.

Easy to use in daily routine, a maximum of intelligent analytical support, highly flexible even for most demanding applications: High performance X-ray fluorescence analysis (XRF) is made easy with SPECTRA^plus and SPECTRA EDX. The complete software packages for qualitative, standardless and quantitative analysis offering all the benefits of the modern software operation from fast point-and-click operation to real multitasking. The standardized look-and-feel as well as the extensive help files make it easy to use from the very beginning: Simple and fast operation with minimal training required.

The integrated "Daily-Check-Routine" of SPECTRA^plus and SPECTRA EDX is the base for simple periodical instrument checks according to GLP (Good Laboratory Practice).

Standardless analysis –the major advantages of X-ray fluorescence analysis (XRF) - allows the fast and easy determination of the chemical composition without performing a calibration. Due to powerful matrix correction based on variable alphas every kind of sample can be analyzed with optimized measurement parameters for the chemical composition, no matter which kind of sample preparation has been used. Standardless Analysis with SPECTRA^plus and SPECTRA EDX is flexible: Setting the analytical goal it allows quick determination with fast scan mode or improved accuracy and precision for later interactive evaluation.

In SPECTRA^plus and SPECTRA EDX the standardless calibration is totally integrated for a maximum of analytical support: Optimized measurement conditions are provided for every single element, recommended line overlays and overlay factors are available. The most important advantage is that standardless calibration parameters can be integrated in user specific calibrations to expand dedicated methods for elements where no standards are available: A maximum of flexibility.

Layer thickness and chemical composition of multilayer samples can be easily determined with X-ray fluorescence analysis (XRF). The layered samples are analyzed directly either on the wavelength dispersive X-ray fluorescence spectrometers (WDXRF) S4 PIONEER or S4 EXPLORER.

ML^plus is extending SPECTRAplus for the analysis of single layer and multilayer samples with wavelength dispersive X-ray fluorescence analysis (WDXRF). It allows the direct determination of thickness and composition of layers samples down to several atomic layers (less than 1nm) and up to the µm or even mm-range.

ML^plus is using a full fundamental parameter approach for all calculations. The determination of thickness and composition in ML^plus is based on the standardless calibration of SPECTRA^plus, i.e. no specific multilayer standards are required. Nevertheless any available multilayer standard can be used to optimize the results.

ML^plus can be used for automatic evaluation after each single measurement once a model has been setup. This makes multilayer analysis available for routine process control e.g. in production of layered glass or coated steel.

The control and evaluation software allows for the quick and easy utilzation of the unique features of the ARTAX. All functions for precise positioning of the measuring head, capture and processing of video images, and element analysis are effectively combined with each other and designed for intuitive operation.

Due to the modular and hierarchic architecture of the software the ARTAX is highly flexible and therefore suitable for both routine applications and more demanding scientific research.

This software enables the ARTAX to perform automatic line or area scans. The motorized XYZ drive provides a maximum scan distance of 50 mm in all dimensions.

The Scan software features:

• video-supported, interactive definition of one- or two-dimensional scans
• method-based, automated measurement and evaluation strategies
• storage of full data base for post-processing
• various options for export of images, spectra, and results.

ARTAXQuant enables the quantification of the element contents for single point measurements as well as for multi-point measurements (scans) by the use of a standard comparision method.

The method is based on the results of analyses performed at standard samples with known composition. These results are used to create a sample-specific calibration curve by means of a calibration editor.