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- Bruker Announces New High-Performance Scientific Instruments and Analytical Solutions for Life-Science Research, Industrial and Applied Markets at Analytica 2012
- Successful Bruker/MIT Symposium 2012
- Bruker Announces Acquisition of SkyScan, a Leading Provider of Micro-CT Systems for 3D X-Ray Imaging in Materials Research and Preclinical Studies
- Application Note SC-XRD 390 - The Reactivity of Lithium Organics
- Application Note SC-XRD 389 - Challenging in Many Aspects
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - Introducing XFlash® 6
Jun 13, Webinar - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
Fine and Wide Slicing — Preserve the three-dimensional information of the reflection
Reflections have a three-dimensional shape and an intensity profile. Typically, APEX2 acquires images in fine slicing mode. This mode best preserves the three-dimensional information of the reflection, which makes the software best for integration of even weak reflection intensities.
- Fine Slicing
Fine Slicing — When Every Reflection Counts
- 3D spot profiles and intensities are accurately extracted
- 2theta-dependent profiles from strong reflections are “learnt”
- “Learnt profiles” are fit to weak reflections using least-squares methods
- More accurate bonding geometry with smaller standard deviations
- Wide Slicing
Wide Slicing — Systematically-Poor Data
- Spot shapes are reduced to only a 2D projection
- Data collected with wide frames lacks 3D information
- Challenging samples with twinned or split profiles provide systematically-poor data
