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- New Large Area EDS Detector for Transmission Electron Microscopy
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
- Bruker Announces the e-Flash HR – a New High-Resolution EBSD Detector
- Bruker AXS in Karlsruhe has new phone numbers
- Prof. David C. Joy wins 2010 Duncumb Award for Excellence in Microanalysis
Upcoming Events
- The Benefits of TXRF for Education and University Research
Mar 07, Webinar - Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
Simultaneous EBSD and EDS Acquisition – At Highest Possible Speed
- Combined EBSD and EDS analysis (see text)
Due to the flexibility in positioning both EDS and EBSD detectors, optimum measurement conditions for both can be achieved. The count rate capability of the XFlash® EDS detector enables high speed of up to 520 patterns/s for simultaneous EBSD and EDS data acquisition. EDS information is collected in a hyperspectral database in form of point spectra, the so-called HyperMap. Like the EBSD data the EDS data is stored in a lossless format. It can therefore be presented in many different ways and is available for re-analysis anytime.
The figure shows the procedure of a sample re-analysis with the help of a combined EBSD and EDS measurement. Analyzed was a joined copper-aluminum bar. As copper (Cu) and aluminum (Al) are virtually indistinguishable by EBSD alone (very similar patterns) the according analysis (upper image in the figure) leads to an indexing of almost the entire sample as Cu. Reanalysis using the EDS infomation leads to correct separation into Cu (left) and Al (right), as can be seen in the lower image of the figure.
