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- Bruker Acquires Hecus MICROcaliX(R) Product Line to Expand Product Portfolio for Small Angle X-ray Scattering (SAXS)
- Application Report XRD 13 - D2 PHASER Desktop XRD
- Bruker Expands in China with Opening of Second Major Applications, Training and Service Center in Shanghai
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
- New Developments, interesting Applications, exciting Presentations and Discussions
Upcoming Events
- The Benefits of TXRF for Education and University Research
Mar 07, Webinar - Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
DIFFRACplus SEARCH
SEARCH, the search/match option of the EVA, provides for an unique full pattern approach for qualitative phase analysis. This approach handles even complicated multiphase mixtures and trace phases readily. Since 1988 [1] no other software package ever challenged the performance, speed, accuracy and ease of use of SEARCH:
"The results of this strategy ... have been so dramatic as to be considered a new generation of computer software" [2]
"Perhaps the most important innovation in search/match procedures in recent years..." [3]
Not unexpectedly SEARCH performed best in the international Search-Match Round Robin SMRR 2002 www.cristal.org/smrr.
With full PDF4 support integrated, SEARCH is the most powerful phase identification software on the market also in the foreseeable future: "A new step in the development of Powder Diffraction is certainly there." groups.yahoo.com/group/sdpd/message/961
- Search on the entire observed pattern using all data points
- no restriction to the most intense reflections
- no disregard of reflection asymmetries or shoulders
- no disregard of background regions
- No peak search required
- No preselection of peaks required
- Extremely tolerant with preferred orientation or poor particle statistics effects causing distorted intensities or missing reflections
- Consideration of solid solution effects causing peak shifts
- Consideration of sample uncertainties such as sample height causing 2q errors
[1] Caussin, P., Nusinovici, J. & Beard, D.W. (1988). Adv. X-ray Anal., 31, 423 - 430.
[2] Jenkins, R. & Snyder, R.L. (1996): Introduction to X-ray Powder Diffractometry. Wiley - Interscience, 349-350.
[3] Langford J.I. & Louër, D. (1996): Powder Diffraction. Rep. Prog. Phys. 59, 131-234.
