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- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - Introducing XFlash® 6
Jun 13, Webinar - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
Scanning Tunneling Microscopy (STM)
- In-situ atom resolution electrochemical STM image of Cu underpotential deposition on Au (111)
Scanning Tunneling Microscopy (STM) measures topography of surface electronic states using a tunneling current that is dependent on the separation between the probe tip and a sample surface.
STM is typically performed on conductive and semiconductive surfaces. Common applications consist of atomic resolution imaging, electrochemical STM, Scanning Tunneling Spectroscopy (STS) union and low current imaging of less conductive samples.
