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- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - Introducing XFlash® 6
Jun 13, Webinar - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
Scanning Spreading Resistance Microscopy (SSRM)
- Surface of ZnO, 1.8 x 1.8 µm2, top, SSRM channel, bottom, sample: Prof. A. Waag, TU Braunschweig
Scanning Spreading Resistance Microscopy (SSRM) enables mapping of the differences of resistance and conductivity on the sample surface with nanometer resolution.
A durable and conductive (diamond coated) tip is used in contact mode while an adjustable DC bias voltage is applied between tip and sample. The topography and the current map is acquired simultaneously by measuring the current in a range of up to 7 magnitudes.
SSRM is the method of choice for analyzing electrical properties of electronic devices or conductive polymers.
