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- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - Introducing XFlash® 6
Jun 13, Webinar - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA

ScanAsyst Atomic Force Microscopy Imaging Mode
The World's First Imaging Mode With Automatic Image Optimization Technology
The ScanAsyst™ atomic force microscopy imaging mode is the world's first image-optimization scan mode for AFM microscopes. This patent-pending innovation utilizes intelligent algorithms to automatically and continuously monitor image quality, and to make the appropriate parameter adjustments. This frees researchers from the complex and tedious task of adjusting setpoints, feedback gains, and scan rates, making imaging as easy as simply selecting a scan area and scan size for almost any sample in either air or fluid.
ScanAsyst is based on Bruker's Peak Force Tapping™ mode. This proprietary mode performs a very fast force curve at every pixel in the image. The peak force of each of these curves is then used as the imaging feedback signal, providing direct force control. This allows it to operate at even lower forces than TappingMode, which helps protect delicate samples and tips.
Performance, Speed, and Usability
- Faster, More Consistent Expert-Quality Results
- Direct Force Control Protects Samples and Probes
- Easier Imaging in Air or Fluid on Almost Any Sample
If you have an older AFM microscope please contact Bruker to find out how to upgrade it to an AFM with ScanAsyst capability.
Associated Atomic Force Microscopes
BioScope Catalyst Atomic Force Microscope
Dimension FastScan Atomic Force Microscope
Dimension Icon Atomic Force Microscope
MultiMode 8 Atomic Force Microscope
Brochure and Application Notes
ScanAsyst Atomic Force Microscopy Imaging Mode (Brochure, PDF)
An Introduction to ScanAsyst and Peak Force Tapping Atomic Force Microscopy Modes (Application Note, PDF)
Articles
New Atomic Force Microscopy (AFM) Approaches Life Sciences Gently, Quantitatively, and Correlatively (April 2012 – American Laboratory)

