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News
- Bruker Hosts 10th Annual International Nanoscience Conference
- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - Introducing XFlash® 6
Jun 13, Webinar - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
ScanAsyst Atomic Force Microscopy Imaging Mode
Request More Information
Use the request form below to contact us regarding the ScanAsyst Atomic Force Microscopy Imaging Mode. Also, you may request to arrange a demonstration of the atomic force microscopy imaging mode. If you are using an older AFM microscope and want to upgrade to an atomic force microscope that has ScanAsyst capability - let us know and we will contact you with more information. Finally, be sure to sign up for our Atomic Force Microscopy Email List to stay current on every AFM advancement from Bruker and keep informed about all of our learning resources, events, and opportunities.
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Need to speak with a person? Find an email for an office nearest you? Or do you need a mailing address for our AFM offices? Please use our contact information here.
