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- New Large Area EDS Detector for Transmission Electron Microscopy
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
- Bruker Announces the e-Flash HR – a New High-Resolution EBSD Detector
- Bruker AXS in Karlsruhe has new phone numbers
- Prof. David C. Joy wins 2010 Duncumb Award for Excellence in Microanalysis
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Mar 07, Webinar - Pittcon 2012
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Apr 17-20, Munich, Germany
Revolutionizing EDS analysis on TEMs using silicon drift detectors
Silicon drift detectors are a well established analytical technology on scanning electron microscopes. Bruker AXS Microanalysis, as the technological leader in this field, is the first company that has adapted SDDs for optimal operation on transmission electron microscopes. The XFlash® 5030 T is Bruker‘s detector for this application. Its design has been optimised to cause no interference with the electron optics of all types of transmission and scanning transmission electron microscopes, including aberration corrected instruments. |
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During this webinar we explained the technology of SDDs and particularly focused on Bruker‘s adaptation to (S)TEM operation. We also introduced the ESPRIT software features for transmission electron microscopy included with Bruker‘s QUANTAX EDS systems. Application examples from materials science were presented to demonstrate the performance of the XFlash® on (S)TEMs.
More Information
View a recording of the webinar "Revolutionizing EDS analysis on TEMs using silicon drift detectors"
Revolutionizing EDS analysis on TEMs using Silicon drift detectors
(PDF presentation)
