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- XFlash® 6 – Bruker Introduces the Next Generation of EDS Detectors
- Bruker Announces New High-Performance Scientific Instruments and Analytical Solutions for Life-Science Research, Industrial and Applied Markets at Analytica 2012
- Bruker Announces Acquisition of SkyScan, a Leading Provider of Micro-CT Systems for 3D X-Ray Imaging in Materials Research and Preclinical Studies
- New Large Area EDS Detector for Transmission Electron Microscopy
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - Introducing XFlash® 6
Jun 13, Webinar - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
Fast Re-indexing with up to 54,000 points/s
The EBSD software is capable of re-indexing measurements in incredibly short time. The employed procedure is more than an order of magnitude faster than a completely new measurement. Single phase materials can be re-indexed with around 54,000 points/s. The advantage of re-indexing is that measurements can be re-analyzed when not all phases have been known initially. Even if no phase at all is known, the detected band positions can be used to recalibrate the system later and use the fast re-indexing afterwards for a successive analysis of the microstructure. This works even better if EDS information can be used for further phase discrimination.
The figure contains an orientation map of a deformed ferritic steel sample, original map size 1600 x 1200 (1,920,000) patterns, pixel size: 0.610µm, re-indexed in 36 s, 54,000 points/s, 1.6% zero solution.


