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News
- XFlash® 6 – Bruker Introduces the Next Generation of EDS Detectors
- Bruker Announces New High-Performance Scientific Instruments and Analytical Solutions for Life-Science Research, Industrial and Applied Markets at Analytica 2012
- Bruker Announces Acquisition of SkyScan, a Leading Provider of Micro-CT Systems for 3D X-Ray Imaging in Materials Research and Preclinical Studies
- New Large Area EDS Detector for Transmission Electron Microscopy
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - Introducing XFlash® 6
Jun 13, Webinar - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
QUANTAX Hardware
The QUANTAX system hardware comprises a state-of-the-art Windows system computer, X-ray detector, signal processing electronics and an I/O adaptor with integrated scan system.
Detectors
- The XFlash® detector family
QUANTAX for S/TEM is available with the models 6T|30 or 6T|60 from the liquid nitrogen free XFlash® 6 silicon drift detector (SDD) series. These detectors have been specially developed for use on TEM and STEM, influencing the perfomance of these instruments only minimally, even at highest magnification.
The XFlash® 6T|30 warrants best analytical performance under all count rate conditions. The detector is also insensitive to "overload" conditions and recovers within seconds after crossing a support grid.
The XFlash® 6T|60 is a large area detector for highest analytical demands. Specialized for analysis under adverse conditions, this detector delivers optimum results at low beam currents and during analysis of samples with low X-ray yield.
Signal Electronics
- Signal Processing Unit SVE6
The new signal processing unit with hybrid technology is a key component of QUANTAX. It offers superior pulse processing speed and guarantees reliable results at any count rate. The processor is capable of over 600 kcps output count rate at more than 1,500 kcps input.
Features:
- Support of up to four detectors in one system
- Separate slider control for each detector
- Hardware and software interlock for safe detector operation
- Noise free sensor supply
- Precise temperature control
- Ultra high throughput
- Optimum energy resolution
- User controlled and automatic operation
I/O Adaptor with Scan System
- IO-Scan adaptor PCI board with scan system
The IO-Scan adapter board provides the interface between the signal electronics and the system computer. It allows the connection of up to four X-ray detectors simultaneously through the proprietary MegaLink interface.
A full featured scan generator for external beam control with wide range analog XY-outputs and software selectable scan resolution up to 4096 x 4096 pixels is included as well. It accepts two independent analog image signals and provides eight programmable pulse counters.
