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- XFlash® 6 – Bruker Introduces the Next Generation of EDS Detectors
- Bruker Announces New High-Performance Scientific Instruments and Analytical Solutions for Life-Science Research, Industrial and Applied Markets at Analytica 2012
- Bruker Announces Acquisition of SkyScan, a Leading Provider of Micro-CT Systems for 3D X-Ray Imaging in Materials Research and Preclinical Studies
- New Large Area EDS Detector for Transmission Electron Microscopy
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
Hardware
The QUANTAX system hardware comprises a state-of-the-art Windows system computer, X-ray detector, signal processing electronics and an I/O adaptor with integrated scan system.
XFlash® Detectors
QUANTAX can be equipped with different models of the liquid nitrogen free XFlash® 6 silicon drift detector (SDD) series that range in active areas from 10 to 100 mm2. The user has a choice between the
- XFlash® 6|10 for applications that require optimum energy resolution and light element performance
- XFlash® 6|30 as a versatile SDD that provides both excellent energy resolution and good solid angle
- XFlash® 6|60 as a large area detector for nano-analysis
- XFlash® 6|100 as the largest area SDD for low beam current applications
Energy resolution ranges down to a previously unheard of 121 eV at Mn K for the limited edition model of the XFlash® 6|10, and also the larger detectors provide excellent performance in this field, for instance the XFlash® 6|30 with 123 eV. Detectors of all sizes display outstanding high count rate performance and can deliver 600 kcps at the output with 1,500 kcps at the input.
Signal Electronics
The new signal processing unit with hybrid technology is a key component of QUANTAX. It offers superior pulse processing speed and guarantees reliable results at any count rate. The processor is capable of over 600 kcps output count rate at more than 1,500 kcps input.
Features:
- Support of up to four detectors in one system
- Separate slider control for each detector
- Hardware and software interlock for safe detector operation
- Noise free sensor supply
- Precise temperature control
- Ultra high throughput
- Optimum energy resolution
- User controlled and automatic operation
I/O Adaptor with Scan System
The IO-Scan adapter board provides the interface between the signal electronics and the system computer. It allows the connection of up to four X-ray detectors simultaneously through the proprietary MegaLink interface.
A full featured scan generator for external beam control with wide range analog XY-outputs and software selectable scan resolution up to 4096 x 4096 pixels is included as well. It accepts two independent analog image signals (i.e., SE and BSE) and provides eight programmable pulse counters.




