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- New Large Area EDS Detector for Transmission Electron Microscopy
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
- Bruker Announces the e-Flash HR – a New High-Resolution EBSD Detector
- Bruker AXS in Karlsruhe has new phone numbers
- Prof. David C. Joy wins 2010 Duncumb Award for Excellence in Microanalysis
Upcoming Events
- The Benefits of TXRF for Education and University Research
Mar 07, Webinar - Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
Hardware
The QUANTAX system hardware comprises a state-of-the-art Windows system computer, X-ray detector, signal processing electronics and an I/O adaptor with integrated scan system.
XFlash® Detectors
QUANTAX can be equipped with different models of the liquid nitrogen free XFlash® 5000 silicon drift detector (SDD) series. You can choose between
- XFlash® 5010 for applications that require optimum energy resolution and light element performance,
- XFlash® 5030 if you use a cold field emission or an environmental SEM,
Note that both detectors are specified at a count rate of 100,000 cps. Energy resolutions down to 123 eV at Mn Kα are available. The members of this innovative detector family are also equipped with an optimized electron trap that permits interference-free analysis at even the lowest acceleration voltages in the electron microscope.
Signal Electronics
The current hybrid pulse processor SVE III combines analog and digital pulse processing techniques for optimal exploitation of the capabilities of our XFlash® SDDs. A single signal processing unit can support up to four detectors simultaneously.
Spectra are collected by a digital signal processor and stored in the internal 4096*32bit MCA. The electronics unit provides versatile interfaces for full remote control as well as high speed data transfer.
I/O Adaptor with Scan System
The IO-Scan adapter board provides the interface between the signal electronics and the system computer. It allows the connection of up to four X-ray detectors simultaneously through the proprietary MegaLink interface.
A full featured scan generator for external beam control with wide range analog XY-outputs and software selectable scan resolution up to 4096 x 4096 pixels is included as well. It accepts two independent analog image signals (i.e., SE and BSE) and provides eight programmable pulse counters.




