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- New Large Area EDS Detector for Transmission Electron Microscopy
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
- Bruker Announces the e-Flash HR – a New High-Resolution EBSD Detector
- Bruker AXS in Karlsruhe has new phone numbers
- Prof. David C. Joy wins 2010 Duncumb Award for Excellence in Microanalysis
Upcoming Events
- The Benefits of TXRF for Education and University Research
Mar 07, Webinar - Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
QUANTAX EDS for SEM – Step up to a New Level of Speed and Accuracy!
QUANTAX is one of the most powerful systems available for energy dispersive X-ray microanalysis on SEM and electron microprobe.
Several system levels and a multitude of options are available for scaling and tuning QUANTAX to a wide range of analytical tasks and application environments. Systems of all levels provide state-of-the-art qualitative as well as true standardless quantitative elemental analysis. This includes the new TQuant package for standardless quantification of light elements and low energy peaks. A standard based Φ(ρ, z) quantification package is available for dedicated analytical tasks.
The intuitive user interface, the flexible project management system and various options for quick and comprehensive report generation complement the analytical toolboxes. The individual ESPRIT software tools are designed for easy and intuitive operation; yet include many powerful options for expert users.
Our liquid nitrogen free XFlash® detectors with the proven silicon drift chamber principle provide the highest reliability and the best performance available.
More Information
QUANTAX - X-ray Microanalysis on SEM and TEM (PDF brochure, concise)
QUANTAX - EDS Analysis for SEM and TEM (PDF brochure, extended)


