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Product News
- Bruker meets the challenges of nanoanalysis
- Bruker AXS Microanalysis Introduces New Ultra-High Energy Resolution XFlash® 5000 Silicon Drift Detector Series at M&M 2008
- Dr. Joseph Goldstein, Distinguished Professor,University of Massachusetts, Amherst Wins 2008 Duncumb Award for Excellence in Microanalysis
Upcoming Events
- AXSCEM 2009
The date has changed! - 20th International Congress on X-ray Optics and Microanalysis
Sep 14-18, Karlsruhe
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QUANTAX - step up to a new level of speed and accuracy!
- EDS-System QUANTAX
QUANTAX is one of the most powerful systems available for energy dispersive X-ray microanalysis on SEM and electron microprobe.
Several system levels and a multitude of options are available for scaling and tuning QUANTAX for a wide range of analytical tasks and application environments. Systems of all levels provide state-of-the-art qualitative as well as true standardless quantitative elemental analysis. A standard based Φ(ρ, z) quantification package is optionally available for dedicated analytical tasks.
The intuitive user interface, the flexible project management package and various options for quick and comprehensive report generation complement the analytical toolboxes. The individual ESPRIT software tools are designed for easy and intuitive operation; yet include many powerful options for expert users.
Our liquid nitrogen free XFlash® Detectors with the proven SDD technology provide the highest reliability and the best performance available.
