Practical Spectrum Imaging: Rapid Collection for Routine Analysis

The ability to quickly and accurately map element distribution over a sample area has become essential to material analysts involved with QA/QC, forensics, art conservation, and other scientific disciplines. High-speed X-ray detectors, coupled with powerful Spectrum Imaging tools, now automatically extract composition information in minutes, making X-ray microanalysis techniques practical for even routine applications.

During this one-hour webinar, Bruker AXS we presented new X-ray data collection and data mining techniques for samples of all sizes -- from small samples analyzed in an electron microscope to large samples analyzed with an X-ray fluorescence (XRF) instrument. Scientists can learn how these EDS and micro-XRF Spectrum Imaging tools can help them discern even subtle compositional differences, identify phases and find trace elements in their samples.