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- Bruker Announces New High-Performance Scientific Instruments and Analytical Solutions for Life-Science Research, Industrial and Applied Markets at Analytica 2012
- Bruker Announces Acquisition of SkyScan, a Leading Provider of Micro-CT Systems for 3D X-Ray Imaging in Materials Research and Preclinical Studies
- Bruker Expands its Small Angle X-ray Scattering (SAXS) Product Portfolio
- Bruker Acquires Hecus MICROcaliX(R) Product Line to Expand Product Portfolio for Small Angle X-ray Scattering (SAXS)
- Application Report XRD 13 - D2 PHASER Desktop XRD
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - Introducing XFlash® 6
Jun 13, Webinar - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
Phase identification and quantitative phase analysis options – EVA
- EVA Software
- Supports ICDD PDF2 and PDF4 reference databases
- Simultaneous search in multiple reference databases
- Search working on full-pattern and peak data
- Highly sophisticated residual search
- Search by various selection criteria such as chemical composition, card quality marks, subfiles, and more
- Graphical adjustment of peak positions via tuning of lattice parameters
- Display of stick patterns as well as "Rietveld-type" tick marks with hkl-indices, if available
- Degree of crystallinity determination
- "Combined XRD-XRF analysis": Validation and improvement of search as well as quantitative phase analyses results using elemental analysis results; direct access to SPECTRAplus XRF databases, formatted ASCII-files, and more
- Support of variable counting time data
