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News
- Product Success Story: Bruker Nano Surfaces Division Ships 100th DektakXT Stylus Profiler
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Alcon Selects Bruker ContourGT 3D Microscope for Intra-Ocular Lens R&D
- Bruker’s AcuityXR Receives R&D 100 Award for Technological Innovation
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - Introducing XFlash® 6
Jun 13, Webinar - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
Optical Metrology Module
- Optical Metrology Module
Stand-alone, white light interferometric metrology for critical measurement needs
The technology that powers the Wyko NT series optical profilers is now available in a flexible, stand-alone module.
The Optical Metrology Module or OMM gives you non-contact, gauge-capable metrology for the critical measurement requirements of a wide range of applications.
The Optical Metrology Module brings high-speed, automated optical profiling metrology to the factory floor.
Features
- Stand-alone system allows non-contact, gauge-capable metrology
- Provides in-situ production measurement and even 100% sampling
- Interfaces easily with production systems (mechanical, electrical and data)
