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News
- Product Success Story: Bruker Nano Surfaces Division Ships 100th DektakXT Stylus Profiler
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Alcon Selects Bruker ContourGT 3D Microscope for Intra-Ocular Lens R&D
- Bruker’s AcuityXR Receives R&D 100 Award for Technological Innovation
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - Introducing XFlash® 6
Jun 13, Webinar - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA

Standards
- Pitch Standard - Bruker’s certified pitch standard is primarily used for lateral calibration and magnification calibration.
- Step Height Standards - Bruker provides an 8um and 50um NIST-traceable standard for calibration and monitoring.
- Calibration Standards - A number of calibration standards are available to best match system performance to your system and application certification requirements, including NIST- and PTB-traceable 10µm and 50µm step height standards for tracking system performance and certified pitch standards for magnification and lateral calibrations. Each comes with its own serial number and a Certificate of Calibration. Available standards include 44nm, 88nm, 450nm, 940nm, and 4.5um.

