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- Product Success Story: Bruker Nano Surfaces Division Ships 100th DektakXT Stylus Profiler
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Alcon Selects Bruker ContourGT 3D Microscope for Intra-Ocular Lens R&D
- Bruker’s AcuityXR Receives R&D 100 Award for Technological Innovation
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Jun 06-07, Winona Lake, IN, USA - Introducing XFlash® 6
Jun 13, Webinar - ACHEMA 2012
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Aug 19-21, Philadelphia, Pennsylvania, USA
Stylus and Optical Metrology Brochures and Datasheets
AcuityXR - Enhanced Resolution Microscopy Technology (DS550) | |
AcuityXR™ is a revolutionary optical surface profiler measurement capability that combines unique, patent-pending, Bruker hardware and software technology to enable select ContourGT® Non-Contact, 3D Optical Surface Profilers to break the optical diffraction limit and deliver lateral resolutions previously considered unattainable with conventional optical microscopy techniques. |
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Imaging specifications on both standard and high-resolution cameras for Bruker’s Turret Mountable Standard Objective Series and Non-Turret Mountable Objectives, which include long-working-distance (LWD), through-transmissive media (TTM), and low-magnification objectives. |
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The ContourGT® Family combines advanced 64-bit, multi-core operation and analysis software, patented white light interferometric (WLI) hardware, and unprecedented operator ease-of-use to deliver the most advanced 3D optical surface profilers ever developed. These tenth-generation surface profilers provide fast, angstrom-to-millimeter vertical-range metrology over large fields of view, with flexible sample setup and industry leading repeatability. The ContourGT Family is the most comprehensive and intuitive 3D surface metrology platform available today for production, research and quality control applications. |
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Based on Bruker’s flagship ContourGT® X8, the ContourGT-X8 PSS provides highly-repeatable, high-throughput, precision surface metrology of high-brightness LED (HB-LED) patterned sapphire substrates (PSS) for production QA/QC environments. Offering seamless integration with automated substrate handlers, the ContourGT-X8 PSS enables manufacturers to obtain nanometer-level accuracy and repeatability while simultaneously measuring the height, width and pitch of multiple PSS features with 230X magnification. |
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Based on Bruker’s flagship ContourGT® X8, the ContourGT-X8 PSS provides highly-repeatable, high-throughput, precision surface metrology of high-brightness LED (HB-LED) patterned sapphire substrates (PSS) for production QA/QC environments. Offering seamless integration with automated substrate handlers, the ContourGT-X8 PSS enables manufacturers to obtain nanometer-level accuracy and repeatability while simultaneously measuring the height, width and pitch of multiple PSS features with 230X magnification. |
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Bruker’s DektakXT™ Stylus Profiler features a revolutionary design that enables unmatched repeatability that is better than 5 angstroms. This major milestone in stylus profi ler performance is the culmination of over forty years of Dektak® innovation and industry leadership. Through its combination of industry firsts, DektakXT delivers the ultimate in performance, ease of use and value to enable better process monitoring from R&D to QC. The technological breakthroughs incorporated in this 10th generation Dektak enable critical nanometer-level surface measurements for the microelectronics, semiconductor, solar, high-brightness LED, medical, scientific and materials science industries. |
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Bruker’s NPFLEX™ 3D Surface Metrology System brings unprecedented measurement capability and performance to precision manufacturing industries, enabling faster ramp-up times, improved product quality, and increased productivity. Based on white light interferometry, this non-contact system offers many benefits beyond such traditional contact measurement technologies as coordinate measuring machines (CMMs) and industrial stylus profilers. These benefits include three-dimensional (3D) images, rapid data-rich acquisition, and greater insight into part performance and functionality. The culmination of decades of expertise in interferometric technology and large-sample instrument design, the NPFLEX is the first optical metrology system to handle micro to macro features effortlessly on samples of widely varying sizes. |
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NPFLEX-LA - Non-Contact, 3D Surface Metrology System for Lead Angle (B512) | |
The Bruker NPFLEX-LA™ 3D Surface Metrology System for Lead Angle is the first comprehensive, non-contact metrology solution that repeatably quantifies true lead angle and surface texture of dynamic sealing surfaces. Utilizing the intrinsic benefits of 3D optical profiling, the NPFLEX-LA detects the global lead angle and roughness of sealing surfaces without concern for tedious part alignment, producing results that are gage-repeatable and reproducible. With NPFLEX-LA, Bruker has answered the need for a reliable and extremely accurate measurement technique to better monitor machining quality of dynamic sealing systems. |
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Imaging specifications for Bruker’s NPFLEX Turret Mountable Standard Objective Series and Non-Turret Mountable Objectives, which include extra-long-working-distance (XLWD), through-transmissive media (TTM), and low-magnification objectives. |
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The third-generation SP9900+™ Large- Format Surface Profiling System delivers unmatched measurement performance on substrate panels, bumped substrates, flat panels, and circuit boards for improved process monitoring and increased yields. The SP9900+ incorporates over 10 years of packaging and panel measurement experience to provide unprecedented speed, metrology capability, reliability, serviceability, and manufacturing readiness for 3D critical dimension measurements in large-format applications. |
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