Optical Profiler and Stylus Profiler Webinar Series Archives

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March 28, 2012

Time-to-Data – Keys to Fast, Accurate Metrology

In a growing number of manufacturing lines and QA/QC laboratories the time to result is held with the same importance as the result itself. In this session Bruker scientists will discuss factors that determine the speed of surface metrology and recent advances in metrology solutions to address the time-to-good-data challenge.

February 28, 2012

Obtaining Accurate Surface Measurements

In this webinar, we’ll provide an overview of what it takes to obtain the most accurate surface measurements, particularly relating to 3D optical microscopy but with some emphasis on stylus profilometry as well. Topics covered will include an overview of precision and accuracy, a discussion of calibration (external and self) as well as an overview of data filtering. An example case highlighting the effect of variation in calibration on surface measurement accuracy will be given as well.

January 25, 2012

How to Achieve the Resolution You Need

This webinar explores the range and resolution properties of various metrology instruments including atomic force microscopes, stylus profilers, and three-dimensional microscopes. It will also discuss key factors which must be considered to ensure a given system will meet the needs of a particular process and how to verify performance. Several case studies from different industries are presented to illustrate key factors in choosing the best verification scheme for a given industrial need.

December 14, 2011

3D Surface Measurement Improves Precision Component Design and Production

Two-dimensional, stylus-based metrology systems have quantified surface finish and shape for over 50 years. Ra, Rz, Rpm and other 2D parameters are recognized standards for roughness control. However, as requirements on performance, reliability, and cost tighten, 2D measurements are increasingly unable to properly define and control surfaces. Stylus-based systems typically measure a very small fraction the total surface, have difficulty obtaining consistent results, are prone to tip breakage, and can’t detect many increasingly critical surface properties from a 2D trace.

Due to these limitations, non-contact, three-dimension optical profilers systems have gained steady adoption. ISO is finalizing standards for three-dimensional surface measurements, recognizing that these systems are critical in many industries to provide comprehensive quality control. Such systems offer large areal coverage, achieve higher throughput, provide operator-independent results and capture information which often better controls a process.This webinar will discuss the generation and correlation of 2D and 3D results, the challenges and opportunities associated with migration to 3D measurements, and present a variety of examples illustrating the use of 3D metrology both design and for high volume process control.

December 13, 2011

Accurate 3D Surface Metrology: Key to Manufacturing and Production Success

Many aspects of manufacturing and production across the automotive, aerospace, commercial, and construction equipment industries are similar in nature. Often, surface characteristics play an integral role in the function of large machined or moving parts, including bearing surfaces, shafts, and dynamic seals, among others. Accurately quantifying and reporting on surface roughness, texture, and functional surface parameters during early stages of production enables defect identification at the earliest possible process point. This minimizes production failures, reduces costs, and contributes to just-in-time manufacturing success. In this webcast, experts will discuss a key measurement technology that provides easy operator interface for fast and accurate measurement of 3D topographical parameters, which are critical to functional surface performance. Additionally, case studies from the industry will be described.

November 16, 2011

3D Optical Microscopy: Correlating Industrial Surface Metrology to Enhanced Product Performance

In this free informative webinar, a variety of surface parameters for 3D analysis will be described and discussed, and a few specific examples from industrial applications will be presented such as: relevant 3D areal parameters (S-parameters); how 3D optical microscopy data, to include functional S-parameters, provide insight into surface performance and; how 3D optical microscopes offer an excellent non-contact metrology solution with gage capability for production line use.

November 15, 2011

Material Wear Characterization in Medical Implants with 3D Optical Microscopy: Scar Depth and Volume Removal

3D microscopy based on white-light interferometry has provided precise, quantifiable three-dimensional surface measurements for over 25 years. Over the past few years interest has grown in using this method to measure the quality and wear of medical implant surfaces. This interest has developed because 3D microscopy can deliver rapid, non-contact surface area measurements with sub-nm vertical and sub-micron lateral resolution. Fields of view of many millimeters can be obtained, and large areas may be examined by stitching together multiple measurements.

October 26, 2011

Beating the Optical Diffraction Limit

This free educational webinar, hosted by R&D Magazine, will share how Bruker's award-winning AcuityXR software technology, enables select ContourGT 3D Optical Microscopes to break the optical diffraction limit and deliver lateral resolutions previously considered impossible to achieve with conventional optical microscopy techniques.

October 12, 2011

Rapid Quantification of Corrosion and Wear Using 3D Optical Microscopy

This free webinar, hosted by the Society of Tribologists and Lubrication Engineers (STLE), addressed the "Rapid Quantification of Corrosion and Wear Using 3D Optical Microscopy." The presentation included discussions on rapid surface evaluation, tribology and corrosion-related topics, evaluation of materials and protective coatings for corrosion and wear reduction.

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September 20, 2011

Advances in High-Brightness LED Metrology Capabilities for R&D and Production Inspection

3D optical microscopy, stylus profilometry, and atomic force microscopy provide highly complementary measurement capabilities required for adequate design & process control needs that are being driven harder than ever by the worldwide advances in high-brightness LED manufacturing.

This exclusive webinar presentation demonstrated how the three surface measurement systems combine to meet critical requirements in a highly cost-effective manner.

July 19, 2011

Precision Metrology for Enhanced Solar Efficiency

The solar industry is continuously evolving with advances in materials research. Despite differences in materials and manufacturing technologies in use for solar cell collectors (traditional silicon, amorphous silicon, III-IV multi-junction collectors, thin film CIGS structures, to name a few), a common method for process control relating product performance to a quantifiable material characteristic is in demand.

The surface texture of collector materials has long been known to influence the efficiency of light collection as well as ultimate conversion of photon energy to electrical energy; however, the precise nature of this influence was previously anecdotal and based on estimates from bright field imaging and stylus traces to provide the basis for any comparison between materials.

Recently, certain of the three-dimensional (3D) S-parameters currently under consideration for adoption by the ISO as international standards have been shown to quantitatively correlate surface texture with collector efficiency for a wide range of samples. In this webinar recording and PDF presentation slides, we discuss these interesting results as they relate to process control in the growing solar materials market, with focus on both stylus and optical metrology correlation to materials characteristics.

June 14, 2011

Extending Lateral Resolution of Optical Profiling Beyond the Optical Diffraction Limit

AcuityXR measurements performed with Bruker's ContourGT series 3D microscopes, produce higher lateral resolution measurement of features than has ever before been achieved in a commercial microscope. With AcuityXR, three-dimensional surface maps with sub-nm vertical resolution and lateral resolution down to 130nm are achieved using conventional optics and visible light. This resolution is approximately three times smaller than the diffraction limit of the optics. AcuityXR allows for surface details to be measurable at a similar scale to an atomic force microscope or scanning electron microscope, but using non-contact, visible microscopy, which is fast, highly accurate, and very easy to use. With AcuityXR, high spatial resolution measurements become accessible to a much broader audience and to many more applications than was previously possible.

Topics

• An introduction of ContourGT 3D microscopes

• Learn the basics behind the revolutionary AcuityXR measurements

• See examples of high and low magnification measurements taken with and without AcuityXR

• A demonstration of the AcuityXR's superior quantitative metrology of very fine features

This worldwide webinar presented leading edge content for anyone interested in optical profiling and surface metrology. The recording and slides from this event are now available for you.

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May 10, 2011

Recent Advances in Stylus Profiler Technology

Widely used for over 40 years, recent improvements enable critical nanometer-level surface measurements for microelectronics, semiconductor, photovoltaic, high-brightness LED, medical, scientific and materials science to deliver much tighter control along each step of the development process with up to 40% faster throughput and unmatched 5Å step height repeatability.

• Strengths and Weaknesses of Available Metrology Techniques

• Why Stylus Metrology is Ideal for Thin Film Applications

• Practical Application of Stylus Metrology

• Technological Advances in Repeatability, Resolution, and Speed with the DektakXT

• Innovative Breakthroughs in Ease of Use

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November 10, 2010

Enhancing LED yield via Comprehensive Surface Metrology

This archived webinar discusses critical surface measurements in the high-brightness LED industry which can affect vital product yield. We discussed the measurement parameters and instrumentation used to obtain them in a gauge-capable manner in both research and production environments.