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Product News
- Bruker AXS Announces Closing of S.I.S. Acquisition and Exhibits its New Atomic Force Microscopy (AFM) Product Line at EMC 2008
- Quantitative Screening for RoHS Regulated Elements by XRF
- Bruker AXS Announces Agreement to Acquire Atomic Force Microscopy (AFM) Company S.I.S. Surface Imaging Systems GmbH
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2008 Bruker AXS Scholarship
To indicate your interest in participating in our scholarship program, please complete the entry form below at your earliest convenience. Papers are to be submitted separately according to guidelines in contest rules.
All fields are required.
Bruker AXS Inc. XRD Scholarship Terms and Conditions
1) Applicant must be an author on submitted paper.
2) Applicant must optain permission to submit paper from all co-authors.
3) Due to copyright considerations, no previously published papers will be accepted.
4) Any tax liability is sole responsibility of recipient(s).
5) Bruker AXS reserves the right to publish, both electronically and in print, any papers submitted for scholarship consideration.
6) All decisions are final and may not be disputed.
7) Bruker AXS may cancel contest at any time, for any reason. In the event of cancellation, entrants will be notified by mail or e-mail. All electronic copies of submitted papers will be deleted and not published, in any form, by Bruker AXS.

