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NPFLEX 3D Surface Metrology System

Delivering New Perspective to Precision Manufacturing

The NPFLEX 3D Metrology System from Bruker provides the most flexible, non-contact 3D areal surface characterization available on the market for large samples, such as orthopedic medical implants and large and unusual parts routinely seen in aerospace, automotive and precision machining industries. Based on white-light interferometry, the NPFLEX provides data density, resolution, and repeatability beyond what is possible with contact instrumentation, making it ideal as both a complementary technology or as a stand-alone metrology solution. A breakthrough open-gantry design affords over 300 degrees of access to surfaces previously too difficult to analyze due to size or part orientation. The NPFLEX enables superior flexibility, accuracy, and throughput for precision manufacturing, providing an easy path to tighter tolerances, more efficient processes, and better end products.

Measurement Flexibility to Characterize Large Shapes and Critical Angles

  • Innovative design accommodates samples of widely varied size and shape
  • Handles samples up to 13-inches tall, and up to 200 pounds in weight
  • Open gantry, custom fixturing, and optional swivel head reveals previously inaccessible areas of interest

Definitive Results from High-Density, 3D Areal Information

  • Each measurement contains complete surface information for multi-variable analyses
  • More data leads to better decisions

Revealed Detail at Nanometer Resolution

  • Interferometry provides sub-nanometer vertical resolution at every pixel
  • Industry-proven technology ensures statistical certainty to achieve tighter tolerances

Throughput and Efficiency Gains through Rapid Data Acquisition

  • Minimal sample preparation and measurement setup reduces time to result
  • Large field of view characterizes more information about surfaces than contact measurement techniques

More Information

NPFLEX 3D White Light Interferometric Profilometer (PDF brochure)

NPFLEX Objectives Chart (PDF datasheet)

Bruker´s Support Programs – Nano Surfaces Business (PDF brochure)

3D Interferometric Microscopy Reveals Medical Implant Wear Mechanisms (Publication, Oct. 2011 – Laser Focus World)

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