NEOS Specifications


Scan range	80 µm x 80 µm x 6 µm, closed loop operation
Noise level	< 0.2 nm rms in vertical direction (Z)
Linearity	< 1%, closed loop scanning
Detection principle	fiber optical interferometry, noise level < 0.01 nm rms
Calibrated deflection	cantilever displacement and amplitudes in nanometer, not mV
Tips	silicon tips, various types
Tip change	adjustment free
Digital input resolution	16 bit A/D
Digital output resolution	16 bit D/A
Input channels	max. 8 simultaneous
External inputs	max. 3
Processing	internal 32 bit DSP, typ. 50 MHz
Computer interface	USB (standard universal serial bus)
Operating system	MS-Windows XP®, Vista®
Microscope	Nikon Eclipse with bright/dark field, differential interference contrast (DIC) optional
Positioning	manual translation stage 25 mm x 25 mm
Weight	approximately 50 kg
Material	granite