The NEOS

The NEOS is a high resolution surface inspection microscope that combines a research grade optical microscope and an interferometry based AFM.

The NEOS extends the capabilities of optical microscopes by generating real 3D data –with AFM level spatial resolution independent on the material.

Due to this unique hybridization of optical microscopy and AFM the NEOS complements data achieved by conventional optical microscopy, confocal laser scanning microscopes or white light interferometric microscopy but also data from conventional AFMs and Electron Microscopes.

How does this work?

NANOS - the compact AFM scanning head - is mounted in the turret like an optical lens. By one turn of the turret the system is ready for an AFM scan including all the benefits AFM offers for your application:

• Lateral resolution up to 2 nm and
• Vertical resolution up to 0.2 nm
• Real 3D data
• Additional sample info like magnetic or electric/electronic properties
• Adjustable field of view from a maximum of 80 µm x 80 µm down to 100 nm x 100 nm or even smaller

Two additional key features will make the NEOS your favorite tool:

• Navigated AFM: Seamless integration of AFM and upright optical microscopy provides the ability to quickly and easily locate the feature of interest
• Productive AFM: Unique AFM design eliminates need for experienced AFM users and provides useable data within minutes

Application Examples

The NEOS is used in metallurgy, glass processing, photo voltaic, polymer research, inspection of fibers and many other areas which require optical tools with increased lateral resolution.