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- Bruker Announces New High-Performance Scientific Instruments and Analytical Solutions for Life-Science Research, Industrial and Applied Markets at Analytica 2012
- Bruker Announces Acquisition of SkyScan, a Leading Provider of Micro-CT Systems for 3D X-Ray Imaging in Materials Research and Preclinical Studies
- Bruker Expands its Small Angle X-ray Scattering (SAXS) Product Portfolio
- Bruker Acquires Hecus MICROcaliX(R) Product Line to Expand Product Portfolio for Small Angle X-ray Scattering (SAXS)
- Application Report XRD 13 - D2 PHASER Desktop XRD
Upcoming Events
- OrthoTec 2012
Jun 06-07, Winona Lake, IN, USA - ACHEMA 2012
Jun 18-22, Frankfurt/M., Germany - Seeing at the Nanoscale 2012
Jul 09-11, Bristol, UK - ACA Annual Meeting
Jul 28-Aug 01, Boston, Massachusettes, USA - ACS Fall
Aug 19-21, Philadelphia, Pennsylvania, USA
D8 DISCOVER with DAVINCI design – Advanced X-ray Diffraction System for Materials Research Applications
The D8 DISCOVER with DAVINCI design increases ease-of-use with real-time component detection, plug-and-play functionality and fully integrated 2-dimensional XRD2 capabilities. These unique features allow the user to easily switch between all materials research X-ray diffraction applications, including reflectometry, high-resolution diffraction, grazing incidence diffraction (IP-GID), small angle X-ray scattering (SAXS), as well as residual stress and texture investigations.
Two-dimensional VǺNTEC-500 detector
In particular, for micro-diffraction and ultra-fast reciprocal space mapping, the new two-dimensional VǺNTEC-500 detector with 2048x2048 channels at 144 cm2 active area provides highest sensitivity for detecting even the weakest diffraction signals in short measurement times. The D8 DISCOVER with DAVINCI design is designed to meet all the latest X-ray safety regulatory requirements, providing scientists peace-of-mind.
Snap-lock X-ray optics with tool-free switching of the diffraction geometry
An integral part of the D8 DISCOVER with DAVINCI design is the new DIFFRAC.SUITE™ software with consistently implemented automation functionality. An X-ray optics module, a detector, or any accessory mounted onto the instrument registers itself in real-time with its relevant parameters and analytical capabilities, including powerful detection of possible component conflicts. The factory-aligned, snap-lock X-ray optics provide true ‘plug-and-play’ functionality, including automatic and tool-free switching of the diffraction geometry with minimal user intervention. The DIFFRAC.SUITE offers intuitive operation based on a graphical user interface that can be customized to match the operator’s requirements.


